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Comparison of junction temperature variations of IGBT modules under DC and PWM power cycling test conditions
Tong An Yanzhong Tian Fei Qin Yanwei Dai Yanpeng Gong
Pei Chen
Vol. 22, No. 9, pp. 1561-1575, Sep. 2022
10.1007/s43236-022-00449-3
Pei Chen
Vol. 22, No. 9, pp. 1561-1575, Sep. 2022
10.1007/s43236-022-00449-3
Investigation on Intermittent Life Testing Program for IGBT
Yu Cheng Guicui Fu Maogong Jiang Peng Xue
Vol. 17, No. 3, pp. 811-820, May 2017
10.6113/JPE.2019.17.3.811
Vol. 17, No. 3, pp. 811-820, May 2017
10.6113/JPE.2019.17.3.811